TITLE: Structure and Imperfections in Amorphous and Crystalline Silicon Dioxide
AUTHOR: R. A. B. Devine, J. P. Duraud, E. Dooryhée
Silicon dioxide is one of the most common naturally occurring materials.
Its applications range from nuclear waste storage to optical fibre
communications to silicon microelectronics.
Experts from America, Europe and Japan have written chapters covering
both the amorphous and the crystalline phases of the material with particular
reference to its structure and defects.
The book is divided into four sections: Topological Models for the Crystalline
and Amorphous Phases Electronic Structure Macroscopic and Point Defects
Processing and Applications of Crystalline and Amorphous Phases Engineers,
researchers and postgraduate students of materials science, physics and
engineering will all find this an extremely useful addition to their libraries.
TABLE OF CONTENTS:
Part I Topological Models for the Crystalline and Amorphous Phases
Part 2 Low-Pressure Crystalline Phases of SiO2
Part 3 Theoretical Investigations of the Structure of Amorphous SiO2 at Elevated Pressure
Part 4 Nuclear Magnetic Resonance as a Structural Probe of SiO2
Part 5 Neutron and X-Ray Scattering Studies of Vitreous Silica
Part 6 Molecules as a Basis for Modeling the Force Field of Silica
Part 7 First Principles Calculation of the Electronic Structures of Crystalline and Amorphous
Part 8 The Electronic Structure of Silica Using Ab Initio Pseudopotentials
Part 9 X-Ray Absorption Near Edge Structures of SiO2
Part 10 Electron Energy Loss Structures of SiO2
Part 11 Theory of Electronic and Structural Properties of Point Defects in SiO2
Part 12 Radiation-Induced Defects and Electronic Modification
Part 13 Transient Defects and Electronic Excitation
Part 14 Radiation-Induced Defects and Structural Modifications
Part 15 Quartz Oscillators
Part 16 Science and Technology of Silica Lightguides for Telecommunications
Part 17 Microstructure, Surface Chemistry, and Properties of Silica Gels